Mathias Rommel

Publication Activity (10 Years)

Years Active: 2007-2024
Publications (10 Years): 6

Top Topics

Room Temperature

Sensing Modalities

Top Venues

Microelectron. Reliab.

Publications

Jannik H. Schwarberg, Robin Karhu, Birgit Kallinger, Mathias Rommel, Robin Schmidt, Jörg Schulze
Investigation of CMOS Single Process Steps on 4H-SiC a-Plane Wafers for Quantum Applications. MIPRO (2024)
Nicola J. Rinaldi, Rosalba Liguori, Alexander May, Chiara Rossi, Mathias Rommel, Alfredo Rubino, Gian Domenico Licciardo, Luigi Di Benedetto
A 4H-SiC CMOS Oscillator-Based Temperature Sensor Operating from 298 K up to 573 K. Sensors 23 (24) (2023)
Nicola J. Rinaldi, Gian Domenico Licciardo, Luigi Di Benedetto, Mathias Rommel, Tobias Erlbacher
A DC SPICE Level 3 Model for 4H-SiC lateral NMOSFET under strong inversion conditions. PRIME (2023)
Yunfan Niu, Jiarui Mo, Alexander May, Mathias Rommel, Chiara Rossi, Joost Romijn, Guoqi Zhang, Sten Vollebregt
Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications. SENSORS (2023)
T. H. Nouibat, Zitouni Messai, D. Chikouch, Z. Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey
Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectron. Reliab. 91 (2018)
Maiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann
s for Temperature Sensing. Sensors 17 (11) (2017)
N. Rouag, Z. Ouennoughi, Mathias Rommel, Katsuhisa Murakami, Lothar Frey
Current conduction mechanism of MIS devices using multidimensional minimization system program. Microelectron. Reliab. 55 (7) (2015)
Moritz Hackenberg, Mathias Rommel, Maximilian Rumler, Jürgen Lorenz, Peter Pichler, Karim Huet, Razvan Negru, Giuseppe Fisicaro, Antonino La Magna, Nadjib Taleb, Maurice Quillec
Melt depth and time variations during pulsed laser thermal annealing with one and more pulses. ESSDERC (2013)
Mathias Rommel, Anton J. Bauer, Heiner Ryssel
Quantitative oxide charge determination by photocurrent analysis. Microelectron. Reliab. 47 (4-5) (2007)