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Investigation of the reliability of 4H-SiC MOS devices for high temperature applications.

Martin Le-HuuHolger SchmittStefan NollMichael GriebFrederik F. SchreyAnton J. BauerLothar FreyHeiner Ryssel
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high temperature
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  • learning algorithm
  • fuzzy sets
  • embedded devices