Aneta Prijic

Publication Activity (10 Years)

Years Active: 2010-2023
Publications (10 Years): 4

Top Topics

Multiple Access

Mechanisms Underlying

Top Venues

IEEE Trans. Educ.

Microelectron. Reliab.

J. Circuits Syst. Comput.

Publications

Danijel Dankovic, Milos Marjanovic, Nikola Mitrovic, Emilija Zivanovic, Milan Dankovic, Aneta Prijic, Zoran Prijic
The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering. IEEE Trans. Educ. 66 (2) (2023)
Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. J. Circuits Syst. Comput. 31 (18) (2022)
Ninoslav Stojadinovic, Snezana Djoric-Veljkovic, Vojkan Davidovic, Snezana Golubovic, Srboljub Stankovic, Aneta Prijic, Zoran Prijic, Ivica Manic, Danijel Dankovic
NBTI and irradiation related degradation mechanisms in power VDMOS transistors. Microelectron. Reliab. (2018)
Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Zoran Prijic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, D. Spassov, Ninoslav Stojadinovic
A review of pulsed NBTI in P-channel power VDMOSFETs. Microelectron. Reliab. 82 (2018)
Danijel Dankovic, Ljubomir Vracar, Aneta Prijic, Zoran Prijic
An Electromechanical Approach to a Printed Circuit Board Design Course. IEEE Trans. Educ. 56 (4) (2013)
Ivica Manic, Danijel Dankovic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic, Ninoslav Stojadinovic
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions. Microelectron. Reliab. 51 (9-11) (2011)
Ninoslav Stojadinovic, Danijel Dankovic, Ivica Manic, Aneta Prijic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Zoran Prijic
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress. Microelectron. Reliab. 50 (9-11) (2010)