Login / Signup

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.

Ivica ManicDanijel DankovicAneta PrijicVojkan DavidovicSnezana Djoric-VeljkovicSnezana GolubovicZoran PrijicNinoslav Stojadinovic
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • power consumption
  • estimation accuracy
  • sufficient conditions
  • energy consumption
  • multi channel
  • database
  • data sets
  • genetic algorithm
  • closely related
  • estimation algorithm
  • estimation process