Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.
Sandra VeljkovicNikola MitrovicVojkan DavidovicSnezana GolubovicSnezana Djoric-VeljkovicAlbena PaskalevaDencho SpassovSrboljub StankovicMarko S. AndjelkovicZoran PrijicIvica ManicAneta PrijicGoran S. RisticDanijel DankovicPublished in: J. Circuits Syst. Comput. (2022)