Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.
Ninoslav StojadinovicDanijel DankovicIvica ManicAneta PrijicVojkan DavidovicSnezana Djoric-VeljkovicSnezana GolubovicZoran PrijicPublished in: Microelectron. Reliab. (2010)