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Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.

Ninoslav StojadinovicDanijel DankovicIvica ManicAneta PrijicVojkan DavidovicSnezana Djoric-VeljkovicSnezana GolubovicZoran Prijic
Published in: Microelectron. Reliab. (2010)
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