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NBTI and irradiation related degradation mechanisms in power VDMOS transistors.

Ninoslav StojadinovicSnezana Djoric-VeljkovicVojkan DavidovicSnezana GolubovicSrboljub StankovicAneta PrijicZoran PrijicIvica ManicDanijel Dankovic
Published in: Microelectron. Reliab. (2018)
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