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NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs.

Danijel DankovicIvica ManicSnezana Djoric-VeljkovicVojkan DavidovicSnezana GolubovicNinoslav Stojadinovic
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • power consumption
  • estimation algorithm
  • multi channel
  • maximum likelihood estimation
  • communication channels
  • case study
  • image quality
  • estimation accuracy
  • physical layer
  • mimo systems
  • power allocation