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Negative bias temperature instability mechanisms in p-channel power VDMOSFETs.
Ninoslav Stojadinovic
Danijel Dankovic
Snezana Djoric-Veljkovic
Vojkan Davidovic
Ivica Manic
Snezana Golubovic
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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power consumption
multi channel
positive and negative
electrical power
wireless channels
channel coding
room temperature
multiple access
mechanisms underlying
real time
data sets
mechanism design
power management
channel state information