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Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs.
Ivica Manic
Snezana Djoric-Veljkovic
Vojkan Davidovic
Danijel Dankovic
Snezana Golubovic
Ninoslav Stojadinovic
Published in:
IET Circuits Devices Syst. (2008)
Keyphrases
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