Login / Signup
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs.
Ivica Manic
Danijel Dankovic
Snezana Djoric-Veljkovic
Vojkan Davidovic
Snezana Golubovic
Ninoslav Stojadinovic
Published in:
Microelectron. Reliab. (2009)
Keyphrases
</>
field effect transistors
power consumption
low variance
multiple input
steady state
database
multi channel
machine learning
trade off
simulated annealing
mathematical analysis
positive effects
decision trees
monte carlo
end to end
communication channels