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Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.
Ninoslav Stojadinovic
Ivica Manic
Snezana Djoric-Veljkovic
Vojkan Davidovic
Danijel Dankovic
Snezana Golubovic
Sima Dimitrijev
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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power consumption
positive and negative
database
real world
learning algorithm
knowledge base
data structure
building blocks
computational power
positively correlated
mechanisms underlying
conversational speech
nano scale