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Integrating embedded test infrastructure in SRAM cores to detect aging.
W. Prates
Letícia Maria Veiras Bolzani
Gurgen Harutyunyan
A. Davtyan
Fabian Vargas
Yervant Zorian
Published in:
IOLTS (2013)
Keyphrases
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dynamic random access memory
power consumption
detection algorithm
detection method
digital images
automatic detection
embedded systems
information exchange
real time
low cost
test data
random access memory