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Integrating embedded test infrastructure in SRAM cores to detect aging.

W. PratesLetícia Maria Veiras BolzaniGurgen HarutyunyanA. DavtyanFabian VargasYervant Zorian
Published in: IOLTS (2013)
Keyphrases
  • dynamic random access memory
  • power consumption
  • detection algorithm
  • detection method
  • digital images
  • automatic detection
  • embedded systems
  • information exchange
  • real time
  • low cost
  • test data
  • random access memory