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A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation.

Juliano BenficaLetícia Maria Bolzani PoehlsFabian VargasJosé LipovetzkyAriel LutenbergEdmundo GattiFernando Hernandez
Published in: J. Electron. Test. (2012)
Keyphrases
  • image analysis
  • statistical analysis
  • real time
  • neural network
  • infrared
  • database
  • information retrieval
  • multiscale
  • search algorithm
  • data analysis
  • control system
  • hidden markov models
  • ambient intelligence