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Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs.
Felipe Lavratti
Letícia Maria Bolzani Poehls
Fabian Vargas
Andrea Calimera
Enrico Macii
Published in:
VLSI Design (2015)
Keyphrases
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hardware and software
low cost
real time
image processing
automatic detection
neural network
defect detection
massively parallel
data acquisition
real world
general purpose
mobile devices
computer systems
feature extraction
case study
learning algorithm
data mining
graphics hardware