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Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs.
Felipe Lavratti
Letícia Maria Veiras Bolzani
Andrea Calimera
Fabian Vargas
Enrico Macii
Published in:
LATW (2013)
Keyphrases
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high speed
sensor networks
detection method
real time
sensor data
logical framework
micron cmos
neural network
low cost
logic programming
detection algorithm
data fusion
modal logic
classical logic
physical design
chip design