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An Efficient Metric-Guided Gate Sizing Methodology for Guardband Reduction Under Process Variations and Aging Effects.

Andres F. GomezVíctor H. Champac
Published in: J. Electron. Test. (2019)
Keyphrases
  • neural network
  • nearest neighbor
  • data sets
  • machine learning
  • development process
  • reduction method
  • step wise