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A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging.

Andres F. GomezVíctor H. Champac
Published in: VLSI-SoC (2015)
Keyphrases
  • digital circuits
  • data flow
  • evolvable hardware
  • model based diagnosis
  • finite state machines
  • significant improvement
  • functional decomposition
  • life span
  • database systems
  • circuit design