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Circuit performance optimization for local intra-die process variations using a gate selection metric.
Víctor H. Champac
Alejandra Nicte-ha Reyes
Andres F. Gomez
Published in:
VLSI-SoC (2015)
Keyphrases
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distance function
optimization process
high speed
global optimization
design process
database
data mining
expert systems
optimization algorithm
process model
optimization method
fine tuning