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Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection.

Víctor H. ChampacAndres F. GomezFreddy ForeroKaushik Roy
Published in: VLSI-SoC (Selected Papers) (2018)
Keyphrases
  • data analysis
  • object detection
  • statistical analysis
  • detection method
  • automatic analysis
  • signal processing
  • automatic detection
  • design considerations
  • defect detection
  • reliable detection