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An efficient EDAC approach for handling multiple bit upsets in memory array.

Roger C. GoerlPaulo Ricardo Cechelero VillaLetícia Maria Veiras BolzaniEduardo Augusto BezerraFabian Luis Vargas
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • random access memory
  • database
  • high speed
  • real world
  • information retrieval
  • image processing
  • combining multiple
  • limited memory