Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era.

Artur Ghukasyan Grigor Tshagharyan Gurgen Harutyunyan Yervant Zorian

Published in: VTS (2023)

Keyphrases

lessons learned
key issues
technical challenges
open issues
real time
data sets
information systems
case study
low cost
high speed
big data
computational power
memory usage
application scenarios