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Overcoming Embedded Memory Test & Repair Challenges in the Gate-All-Around Era.
Artur Ghukasyan
Grigor Tshagharyan
Gurgen Harutyunyan
Yervant Zorian
Published in:
VTS (2023)
Keyphrases
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lessons learned
key issues
technical challenges
open issues
real time
data sets
information systems
case study
low cost
high speed
big data
computational power
memory usage
application scenarios