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A Robust Solution for Embedded Memory Test and Repair.
K. Darbinyan
Gurgen Harutyunyan
Samvel K. Shoukourian
Valery A. Vardanian
Yervant Zorian
Published in:
Asian Test Symposium (2011)
Keyphrases
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optimization method
robust optimization
crew pairing
real time
case study
solution space
solution quality
embedded systems
memory usage
linear equations