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Securing test infrastructure of system-on-chips.
Grigor Tshagharyan
Gurgen Harutyunyan
Samvel K. Shoukourian
Yervant Zorian
Published in:
EWDTS (2016)
Keyphrases
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high speed
image processing
computer systems
test cases
information exchange
integrated circuit
identity management
database
data mining
artificial intelligence
search engine
data collection
information security
statistical tests