Securing test infrastructure of system-on-chips.

Grigor Tshagharyan Gurgen Harutyunyan Samvel K. Shoukourian Yervant Zorian

Published in: EWDTS (2016)

Keyphrases

high speed
image processing
computer systems
test cases
information exchange
integrated circuit
identity management
database
data mining
artificial intelligence
search engine
data collection
information security
statistical tests