A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs.
Gurgen HarutyunyanSamvel K. ShoukourianValery A. VardanianYervant ZorianPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
- high accuracy
- fault detection
- preprocessing
- cost function
- computational cost
- computational complexity
- dynamic programming
- k means
- clustering method
- segmentation method
- segmentation algorithm
- detection algorithm
- objective function
- matching algorithm
- similarity measure
- generation method
- mathematical model
- optimal solution
- decision support system
- artificial intelligence