Sarath Mohanachandran Nair

Publication Activity (10 Years)

Years Active: 2017-2020
Publications (10 Years): 17

Top Topics

Special Session

Electronic Devices

Design Space Exploration

Test Generation

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi B. Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects. IRPS (2020)
Sarath Mohanachandran Nair, Christopher Münch, Mehdi Baradaran Tahoori
Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory. ETS (2020)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Arunkumar Vijayan, Mehdi Baradaran Tahoori
Dynamic Faults based Hardware Trojan Design in STT-MRAM. DATE (2020)
Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Lionel Torres, Sophiane Senni, Guillaume Patrigeon, Pascal Benoit, Gregory di Pendina, Guillaume Prenat
A Universal Spintronic Technology based on Multifunctional Standardized Stack. DATE (2020)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Mitigating Read Failures in STT-MRAM. VTS (2020)
Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Münch, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori, Ying Wang, Huawei Li, Said Hamdioui
Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. VTS (2020)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Houman Zahedmanesh, Kristof Croes, Kevin Garello, Gouri Sankar Kar, Francky Catthoor
Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects. IRPS (2019)
Samir Ben Dodo, Rajendra Bishnoi, Sarath Mohanachandran Nair, Mehdi Baradaran Tahoori
A Spintronics Memory PUF for Resilience Against Cloning Counterfeit. IEEE Trans. Very Large Scale Integr. Syst. 27 (11) (2019)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan
Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS (2019)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM. IEEE Trans. Very Large Scale Integr. Syst. 27 (7) (2019)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Grigor Tshagharyan, Hayk T. Grigoryan, Gurgen Harutyunyan, Yervant Zorian
Defect injection, Fault Modeling and Test Algorithm Generation Methodology for STT-MRAM. ITC (2018)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Parametric failure modeling and yield analysis for STT-MRAM. DATE (2018)
Nour Sayed, Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM. ASP-DAC (2018)
Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat
Using multifunctional standardized stack as universal spintronic technology for IoT. DATE (2018)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Fazal Hameed, Mehdi Baradaran Tahoori
VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (7) (2018)
Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Guillaume Prenat
GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack. ISVLSI (2017)
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mohammad Saber Golanbari, Fabian Oboril, Mehdi Baradaran Tahoori
VAET-STT: A variation aware estimator tool for STT-MRAM based memories. DATE (2017)