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VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool.

Sarath Mohanachandran NairRajendra BishnoiMohammad Saber GolanbariFabian OborilFazal HameedMehdi Baradaran Tahoori
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
Keyphrases
  • machine learning
  • data analysis
  • data mining
  • case study
  • design space exploration