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Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects.

Sarath Mohanachandran NairRajendra BishnoiMehdi Baradaran TahooriHouman ZahedmaneshKristof CroesKevin GarelloGouri Sankar KarFrancky Catthoor
Published in: IRPS (2019)
Keyphrases
  • artificial intelligence
  • camera calibration
  • database
  • real world
  • data mining
  • image processing
  • high speed
  • vision system
  • human computer interaction
  • vlsi design