Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects.
Sarath Mohanachandran NairRajendra BishnoiMehdi Baradaran TahooriHouman ZahedmaneshKristof CroesKevin GarelloGouri Sankar KarFrancky CatthoorPublished in: IRPS (2019)