A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM.
Sarath Mohanachandran NairRajendra BishnoiMehdi Baradaran TahooriPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
- main contribution
- statistical analysis
- image analysis
- probabilistic model
- databases
- modeling framework
- data analysis
- data sets
- image segmentation
- image sequences
- website
- knowledge base
- information systems
- artificial intelligence
- information retrieval
- petri net
- dynamic bayesian networks
- complexity analysis
- colored petri nets