Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory.

Sarath Mohanachandran Nair Christopher Münch Mehdi Baradaran Tahoori

Published in: ETS (2020)

Keyphrases

test generation
test cases
symbolic execution
test sequences
design automation
static analysis
quality assurance
mutation testing
software testing
decision trees
test data generation
code coverage
information systems
high level
memory requirements