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Defect Characterization and Test Generation for Spintronic-based Compute-In-Memory.
Sarath Mohanachandran Nair
Christopher Münch
Mehdi Baradaran Tahoori
Published in:
ETS (2020)
Keyphrases
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test generation
test cases
symbolic execution
test sequences
design automation
static analysis
quality assurance
mutation testing
software testing
decision trees
test data generation
code coverage
information systems
high level
memory requirements