Parametric failure modeling and yield analysis for STT-MRAM.

Sarath Mohanachandran Nair Rajendra Bishnoi Mehdi Baradaran Tahoori

Published in: DATE (2018)

Keyphrases

statistical analysis
expert systems
image analysis
genetic algorithm
statistical modeling
data sets
neural network
feature selection
image segmentation
database systems
hidden markov models
probabilistic model
structural analysis