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Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications.

Grigor TshagharyanGurgen HarutyunyanYervant ZorianAnteneh GebregiorgisMohammad Saber GolanbariRajendra BishnoiMehdi Baradaran Tahoori
Published in: ITC (2018)
Keyphrases
  • fault model
  • test cases
  • search engine
  • test set
  • database
  • learning algorithm
  • modeling language