Innovative Practices on In-System Test and Reliability of Memories.
S. BandyopadhyayJ. MekkothM. HutnerHayk T. GrigoryanArun KumarSamvel K. ShoukourianGrigor TshagharyanYervant ZorianGabriele BoschiDuccio LazzarottiDonato LuongoHanna ShaheenGurgen HarutyunyanPublished in: VTS (2019)