Extending fault periodicity table for testing faults in memories under 20nm.
Gurgen HarutyunyanSamvel K. ShoukourianValery A. VardanianYervant ZorianPublished in: EWDTS (2014)
Keyphrases
- fault model
- fault diagnosis
- fault detection
- test cases
- fault injection
- multiple faults
- fault detection and isolation
- fault isolation
- fault detection and diagnosis
- database
- neural network
- test data
- model based diagnosis
- fuzzy logic
- industrial processes
- expert systems
- database systems
- test set
- high resolution
- fault models
- knowledge base
- repair actions