Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield.

Yervant Zorian Samvel K. Shoukourian

Published in: IEEE Des. Test Comput. (2003)

Keyphrases

embedded systems
computing power
neural network
test cases
database
test data
main memory
memory requirements
information exchange
memory size
digital libraries
operating system
memory usage
ip networks
damage assessment
hardware software co design