IoT: Source of test challenges.

Erik Jan Marinissen Yervant Zorian Mario Konijnenburg Chih-Tsun Huang Ping-Hsuan Hsieh Peter Cockburn Jeroen Delvaux Vladimir Rozic Bohan Yang Dave Singelée Ingrid Verbauwhede Cedric Mayor Robert Van Rijsinge Cocoy Reyes

Published in: ETS (2016)

Keyphrases

real world
key issues
test data
lessons learned
management system
security problems
open issues
information retrieval
machine learning
bayesian networks
data model
training data
test cases
search engine
artificial intelligence
design principles
multiple sources
application scenarios
key management
neural network