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Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides.

Yasuharu KohiyamaC. P. RavikumarYasuo SatoLaung-Terng WangYervant Zorian
Published in: ATS (2007)
Keyphrases
  • real world
  • lessons learned
  • open issues
  • data sets
  • paradigm shift
  • expert systems
  • technical challenges
  • response time
  • differential evolution
  • statistical tests
  • web intelligence