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Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits.

Erik Jan MarinissenYervant Zorian
Published in: J. Electron. Test. (2012)
Keyphrases
  • special issue
  • integrated circuit
  • ai edam
  • ecml pkdd
  • international journal
  • applied intelligence
  • special section
  • multi agent systems
  • fuzzy logic
  • test cases
  • electron beam