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Design for test and reliability in ultimate CMOS.

Michael NicolaidisLorena AnghelNacer-Eddine ZergainohYervant ZorianTanay KarnikKeith A. BowmanJames W. TschanzShih-Lien LuCarlos TokunagaArijit RaychowdhuryMuhammad M. KhellahJaydeep KulkarniVivek DeDimiter Avresky
Published in: DATE (2012)
Keyphrases
  • design space
  • case study
  • single chip
  • database
  • information systems
  • software engineering
  • power consumption
  • computer aided
  • engineering design
  • statistical significance