Design for test and reliability in ultimate CMOS.
Michael NicolaidisLorena AnghelNacer-Eddine ZergainohYervant ZorianTanay KarnikKeith A. BowmanJames W. TschanzShih-Lien LuCarlos TokunagaArijit RaychowdhuryMuhammad M. KhellahJaydeep KulkarniVivek DeDimiter AvreskyPublished in: DATE (2012)