André K. Nieuwland

Publication Activity (10 Years)

Years Active: 2003-2008
Publications (10 Years): 0

Publications

Daniele Rossi, André K. Nieuwland, Cecilia Metra
Simultaneous Switching Noise: The Relation between Bus Layout and Coding. IEEE Des. Test Comput. 25 (1) (2008)
Daniele Rossi, André K. Nieuwland, Steven V. E. S. van Dijk, Richard P. Kleihorst, Cecilia Metra
Power Consumption of Fault Tolerant Busses. IEEE Trans. Very Large Scale Integr. Syst. 16 (5) (2008)
André K. Nieuwland, Samir Jasarevic, Goran Jerin
Combinational Logic Soft Error Analysis and Protection. IOLTS (2006)
Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra
Exploiting ECC Redundancy to Minimize Crosstalk Impact. IEEE Des. Test Comput. 22 (1) (2005)
Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra
New ECC for Crosstalk Impact Minimization. IEEE Des. Test Comput. 22 (4) (2005)
Régis Leveugle, Yervant Zorian, Luca Breveglieri, André K. Nieuwland, Klaus Rothbart, Jean-Pierre Seifert
On-Line Testing for Secure Implementations: Design and Validation. IOLTS (2005)
André K. Nieuwland, Atul Katoch, Daniele Rossi, Cecilia Metra
Coding Techniques for Low Switching Noise in Fault Tolerant Busses. IOLTS (2005)
André K. Nieuwland, Patrick Gindner
Automated Logic SER Analysis and On-Line SER reduction. IOLTS (2004)
Daniele Rossi, A. Muccio, André K. Nieuwland, Atul Katoch, Cecilia Metra
Impact of ECCs on Simultaneously Switching Output Noise for On-Chip Busses of High Reliability Systems. IOLTS (2004)
Claudia Kretzschmar, André K. Nieuwland, Dietmar Müller
Why Transition Coding for Power Minimization of On-Chip Buses Does Not Work. DATE (2004)
André K. Nieuwland, Atul Katoch, Maurice Meijer
Reducing Cross-Talk Induced Power Consumption and Delay. PATMOS (2004)
André K. Nieuwland, Richard P. Kleihorst
IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors. J. Electron. Test. 20 (5) (2004)
André K. Nieuwland, Richard P. Kleihorst
The positive effect on IC yield of embedded Fault Tolerance for SEUs. IOLTS (2003)
Daniele Rossi, Steven V. E. S. van Dijk, Richard P. Kleihorst, André K. Nieuwland, Cecilia Metra
Power Consumption of Fault Tolerant Codes: the Active Elements. IOLTS (2003)