The positive effect on IC yield of embedded Fault Tolerance for SEUs.
André K. NieuwlandRichard P. KleihorstPublished in: IOLTS (2003)
Keyphrases
- fault tolerance
- fault tolerant
- load balancing
- distributed systems
- response time
- high availability
- replicated databases
- distributed computing
- mobile agents
- peer to peer
- group communication
- database replication
- single point of failure
- integrated circuit
- distributed query processing
- failure recovery
- high scalability
- high performance computing
- error detection
- data replication
- fault management
- databases
- embedded systems
- sensor nodes
- knowledge acquisition
- multi agent
- data sets
- component failures