Lee Whetsel

Publication Activity (10 Years)

Years Active: 1988-2010
Publications (10 Years): 0

Publications

Lee Whetsel
Commanded Test Access Port operations. ITC (2010)
Lee Whetsel
A High Speed Reduced Pin Count JTAG Interface. ITC (2006)
Lee Whetsel
Adapting JTAG for AC Interconnect Testing. ITC (2003)
Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur
Overview of the IEEE P1500 Standard. ITC (2003)
Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel
Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices. ITC (2003)
Lee Whetsel
Inevitable Use of TAP Domains in SOCs. ITC (2002)
Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
An analysis of power reduction techniques in scan testing. ITC (2001)
Lee Whetsel
Adapting scan architectures for low power operation. ITC (2000)
Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel
Towards a standard for embedded core test: an example. ITC (1999)
Lee Whetsel
Addressable test ports an approach to testing embedded cores. ITC (1999)
Lee Whetsel
Core test connectivity, communication, and control. ITC (1998)
Lee Whetsel
A silicon El Niño? IEEE Des. Test Comput. 14 (4) (1997)
Lee Whetsel
Test Access of TAP'ed & Non-TAP'ed Cores. ITC (1997)
Lee Whetsel
An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores. ITC (1997)
Lee Whetsel
Proposal to Simplify Development of a Mixed-Signal Test Standard. ITC (1996)
Lee Whetsel
Improved Boundary Scan Design. ITC (1995)
Lee Whetsel
Navigating Test Access in Systems. ITC (1994)
Lee Whetsel
An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures. ITC (1994)
Lee Whetsel
Hierarchically Accessing 1149.1 Applications in a System Environment. ITC (1993)
Lee Whetsel
An IEEE 1149.1 based voltmeter/oscilloscope in a chip. VTS (1993)
Lee Whetsel
A Proposed Method of Accessing 1149.1 in a Backplane Environment. ITC (1992)
Lee Whetsel
An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip. ITC (1991)
Lee Whetsel
Event qualification: a gateway to at-speed system testing. ITC (1990)
Lee Whetsel
A proposed standard test bus and boundary scan architecture. ICCD (1988)