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Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.
Nisar Ahmed
Mohammad Tehranipoor
C. P. Ravikumar
Kenneth M. Butler
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
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low cost
test cases
software testing
real time
fault diagnosis
high speed
low power
unit testing
fault model
fault detection
hardware and software
digital camera
end users
generation process
scan data
fault injection
black box
test data
information retrieval
test suite
machine learning
real world
neural network