Hari Balachandran

Publication Activity (10 Years)

Years Active: 1996-2004
Publications (10 Years): 0

Publications

Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran
K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. ITC (2004)
Hari Balachandran, Kenneth M. Butler, Neil Simpson
Facilitating Rapid First Silicon Debug. ITC (2002)
Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli
Logic mapping on a microprocessor. ITC (2000)
Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC (2000)
Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. VTS (2000)
Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS (1999)
Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana
Clustering based techniques for I_DDQ testing. ITC (1999)
Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala
Expediting ramp-to-volume production. ITC (1999)
Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith
Correlation of logical failures to a suspect process step. ITC (1999)
Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
On applying non-classical defect models to automated diagnosis. ITC (1998)
Hari Balachandran, D. M. H. Walker
Improvement of SRAM-based failure analysis using calibrated Iddq testing. VTS (1996)