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On applying non-classical defect models to automated diagnosis.

Jayashree SaxenaKenneth M. ButlerHari BalachandranDavid B. LavoTracy LarrabeeF. Joel FergusonBrian Chess
Published in: ITC (1998)
Keyphrases
  • information systems
  • probabilistic model
  • data sets
  • multiscale
  • model selection
  • process model
  • computational models
  • accurate models