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K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits.
Wangqi Qiu
Jing Wang
D. M. H. Walker
Divya Reddy
Zhuo Li
Weiping Shi
Hari Balachandran
Published in:
ITC (2004)
Keyphrases
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test generation
test cases
symbolic execution
cmos technology
test sequences
design automation
static analysis
quality assurance
test data generation
software testing
high speed
mutation testing
circuit design
shortest path
multiple input
field effect transistors
real world
open source
code coverage