Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs.
Sri JandhyalaHari BalachandranManidip SenguptaAnura P. JayasumanaPublished in: VTS (2000)
Keyphrases
- similarity measure
- automatic classification
- classification accuracy
- text classification
- classification scheme
- decision trees
- training set
- pattern recognition
- support vector machine
- classification systems
- pattern classification
- classification process
- machine learning
- evaluation model
- supervised classification
- classification rules
- unsupervised learning
- image classification
- feature space
- machine learning methods
- classification method
- classification models
- evaluation method
- class labels
- support vector machine svm
- nearest neighbor