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Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.
Li Xu
Yuming Zhuang
Rajavelu Thinakaran
Kenneth M. Butler
Degang Chen
Published in:
ITC (2017)
Keyphrases
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highly accurate
high accuracy
test cases
database
data mining
information retrieval
expert systems
sensor networks
test data
data acquisition
statistical tests
packet loss