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Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs.

Kenneth M. ButlerKwang-Ting (Tim) ChengLi-C. Wang
Published in: IEEE Des. Test Comput. (2003)
Keyphrases
  • real time
  • high speed
  • multi agent
  • data mining
  • high level
  • multiscale
  • wide range
  • data structure
  • object recognition
  • complex systems
  • special issue