A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data.
Kenneth M. ButlerPublished in: ITC (1999)
Keyphrases
- statistical tests
- data sets
- statistical significance
- high quality
- statistical analysis
- data quality
- data analysis
- test data
- high dimensional data
- training data
- empirical studies
- experimental design
- image data
- data mining techniques
- data structure
- data collection
- database
- synthetic data
- original data
- raw data
- statistical methods
- significant improvement
- noisy data
- trade off
- knowledge discovery
- preprocessing
- test cases
- data processing
- data mining methods
- low quality
- missing data
- spectral clustering
- qualitative and quantitative
- black box
- xml documents
- learning algorithm
- incoming data